Georgia Electron Microscopy
University of Georgia
Contact: John P Shields, PhD
Georgia Electron Microscopy (GEM) provides the University System of Georgia and the scientific community-at-large with expertise in the use and application of electron microscopy methods to a wide variety of problems.
Services include Transmission Electron Microscopy (TEM), Negative Staining/Negative Contrast, Scanning Transmission Electron Microscopy (STEM), and Scanning Electron Microscopy (SEM).
A complete range of conventional preparative services are offered, allowing investigators to submit fresh or fixed tissues and receive end results as requested (i.e. pathologist evaluation and/or digital imaging) within a reasonable turnaround time.
This center is also a regional leader in using STEM and SEM in the low to ultralow kV regime for both imaging and elemental analysis to characterize beam sensitive samples.
Additional capabilities include large area light microscopy (with XY stitching and Z stacking) and large area X-ray fluorescence (XRF) elemental mapping.