Materials Characterization Facility
Georgia Institute of Technology

Contact: Dr. Paul Joseph
Phone: 404-894-5029

The Materials Characterization Facility (MCF) is the core facility for materials analysis at Georgia Tech. Its laboratories include the microanalysis suite in the Marcus Nanotechnology Building, one of the most advanced facilities of its kind in the nation.

Available to academic, industry, and government users, the MCF offers a wide variety of microscopy and characterization tools as well as skilled research staff to support your research needs.

The MCF provides shared-user access to the latest in imaging and analysis technology, which can be accessed by users 24 hours/day. It also provides a full contingent of services for researchers including equipment training, sample prep and measurement, and imaging and analysis consultation.

Broad categories of available equipment include:

  • Scanning and Transmission Electron Microscopy (SEM, TEM)
  • Scanning Probe Microscopy (SPM)
  • Optical Spectroscopy/Microscopy
  • Surface Science
  • X-Ray Diffraction (XRD)


Visit the MCF Website »

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Georgia Tech's Materials Characterization Facility has five broad categories of available equipment.